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 Applications

Power Characterization Measurements

The Power characterization measurements allow manual and automatic measurements in order to optimize for source
or load impedance conditions at fundamental and harmonic frequencies and to generate constant parameter contours.
The parameters include: Input and Output Power, Gain, Gain Compression, Power-Added Efficiency, VSWR, third and
higher order Intermod and Intercept, ACPR (Adjacent Channel Power Ratio), AM/PM, 2nd and 3rd Harmonic Source
and Load Impedances.

All DC currents and voltages are also measurable. The measurements can be made either for constant input power or
for regulated input power in order to maintain another parameter constant (such as Output Power, Gain, ACPR,
Efficiency, etc).

Noise Measurement


            The Y-Factor Measurement Technique                             The Cold-Source Measurement Technique


Bluetec noise measurement system supports "Hot-Cold" and "Cold" source measurements, noise figure source pull,
automatic search for minimum noise figure, automatic measurement of 4 noise parameters, noise measurement at a
single frequency or over a frequency range or a wide range of swept bias values.

Specific Applications

Applications in On-wafer environment in field of 4G communication, WLAN, Wi-Fi , Bluetooth, WCDMA, etc.

 

Application Examples

         On-Wafer Measurements                                                                           Millimeter Wave Load Pull Measurement System                       Applications on Filter Lines of Communication  

 

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